Full Papers
Original, peer-reviewed research contributions presenting significant advances in electronic test.
Systems/CORE A
ITC 2026
International Test Conference
October 11-16, 2026Grand Hyatt San Antonio Riverwalk, TX, USAOfficial conference site Site reachable
The International Test Conference (ITC) is the world’s premier conference dedicated to electronic test of devices, boards, and systems, covering the entire cycle from design verification and test to diagnosis, failure analysis, and feedback to process and design improvement. It brings together engineers, researchers, and executives from across the semiconductor test ecosystem for sessions, tutorials, workshops, networking, and exhibits.
Key deadlines
Verified September 9, 2026Abstract registration
March 21, 2026
AoE
Full paper
April 25, 2026
AoE
Conference timeline
Submission and decisions
Abstract registrationKey deadline
March 21, 2026 · AoE
Full paperKey deadline
April 25, 2026 · AoE
Paper fit
Contribution paths
A strong submission should clearly identify its contribution and evaluate it appropriately.
Short Papers
Concise presentations of emerging ideas, preliminary results, or practical case studies.
Workshop Papers
Papers submitted to specialized workshops, such as the AI in Test (AIT) Workshop.
Tutorial Proposals
Proposals for instructional sessions covering foundational or advanced topics in test.
Session Proposals
Proposals for organized sessions, including panels or special tracks.
Research areas in scope
01
Technical Tracks
Design for TestTest AutomationFault Modeling and DiagnosisBuilt-In Self-Test (BIST)Scan and ATPGMemory TestingAnalog/Mixed-Signal TestingSystem-on-Chip (SoC) Test3D IC and Heterogeneous Integration TestAI in Test (AIT)Automotive TestReliability and Failure AnalysisTest Data Compression and ManagementTest Equipment and AutomationLow-Power TestYield Analysis and ImprovementTest for AI/ML HardwareEdge and IoT Device TestTest Standards and Methodologies
Policies worth checking twice
- Submissions must be original and not under review elsewhere.
- Dual submission to other conferences or journals is not permitted.
- All papers undergo double-blind peer review.
- Papers must not exceed 8 pages in IEEE format.
- Author names and affiliations must be omitted in the submitted version for blind review.
- Author changes after submission require approval from the Program Committee.
- Authors must include an AI-use statement if generative AI tools were used in the preparation of the paper.
Official sources
Compiled from the official call for papers. The organizers’ pages remain authoritative.
Official conference site2026 Program CommitteeProgram2026 IEEE Tutorials & Workshops2026 Call for PapersITC Authors Page
Last verified September 9, 2026